Monitor I/O lines

You can monitor pins you configure as digital input, digital output, or analog input and generate I/O sample data. If you do not define inputs or outputs, no sample data is generated.

Typically, I/O samples are generated by configuring the device to sample I/O pins periodically (based on a timer) or when a change is detected on one or more digital pins. These samples are always sent over the air to the destination address specified by DH (Destination Address High) and DL (Destination Address Low).

You can also gather sample data using on-demand sampling, which allows you to collect the state of the device's I/O pins by issuing an AT command. You can do this on either a local or remote device via an AT command request.

The three methods to generate sample data are:

• Periodic sample (IR (Sample Rate))
  • Periodic sampling based on a timer
  • Samples are taken immediately upon wake (excluding pin sleep)
  • Sample data is sent to DH+DL destination address
  • Can be used with line passing
  • Requires API mode on receiver
• Change detect (IC (DIO Change Detect))
  • Samples are generated when the state of specified digital input pin(s) change
  • Sample data is sent to DH+DL destination address
  • Can be used with line passing
  • Requires API mode on receiver
• On-demand sample (IS (I/O Sample))
  • Immediately query the device’s I/O lines
  • Can be issued locally in Command Mode
  • Can be issued locally or remotely in API mode

These methods are not mutually exclusive and you can use them in combination with each other.